User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: HP 54200A Sub1 DATE: 12-Dec-97 AUTHOR: User Contributed REVISION: 0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 37 NUMBER OF LINES: 237 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK+ X 1.002 ASK- R N P F W 1.003 IEEE [TERM LF] 1.004 HEAD {* Channel 1 DC Offset Accuracy Test *} 1.005 JMP 2.001 1.006 EVAL Dummy 2.001 DISP Connect the output of the 5700A to INPUT 1 of UUT. 2.002 IEEE reset 2.002 IEEE display; format 1 2.002 IEEE channel 1; range 40e-3; offset 1; store ave, 4 2.002 IEEE channel 2; range 40e-3; offset 1; store ave, 4 2.002 IEEE timebase; range 1e-6 2.002 IEEE measure; vmin 1; vmax 1 2.003 5700 1V S 2W 2.004 IEEE [D4000]meas; vmin? 2.005 IEEE [I] 2.006 MEMC 1.000V 0.01U VMIN #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 3.001 5700 1V S 2W 3.002 IEEE [D4000]meas; vmax? 3.003 IEEE [I] 3.004 MEMC 1.000V 0.01U VMAX #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 4.001 IEEE chan 1; offset -1 4.002 5700 -1V S 2W 4.003 IEEE [D4000]meas; vmin? 4.004 IEEE [I] 4.005 MEMC -1.000V 0.01U VMIN #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 5.001 5700 -1V S 2W 5.002 IEEE [D4000]meas; vmax? 5.003 IEEE [I] 5.004 MEMC -1.000V 0.01U VMAX #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 6.001 IEEE chan 1; range 400e-3 6.002 5700 -1V S 2W 6.003 IEEE [D4000]meas; vmin? 6.004 IEEE [I] 6.005 MEMC -1.000V 0.06U VMIN #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 7.001 5700 -1V S 2W 7.002 IEEE [D4000]meas; vmax? 7.003 IEEE [I] 7.004 MEMC -1.000V 0.06U VMAX #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 8.001 IEEE chan 1; offset 1 8.002 5700 1V S 2W 8.003 IEEE [D4000]meas; vmin? 8.004 IEEE [I] 8.005 MEMC 1.000V 0.06U VMIN #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 9.001 5700 1V S 2W 9.002 IEEE [D4000]meas; vmax? 9.003 IEEE [I] 9.004 MEMC 1.000V 0.06U VMAX #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 10.001 HEAD {* Channel 2 DC Offset Accuracy Test *} 10.002 JMP 11.001 10.003 EVAL Dummy 11.001 HEAD Channel 2 DC Offset Accuracy Test 11.002 DISP Move the output of the 5700A to INPUT 2 of UUT. 11.003 IEEE graph 1; source chan 2 11.003 IEEE channel 2; range 40e-3; offset 1; 11.003 IEEE measure; scratch 11.003 IEEE measure; vmin 2; vmax 2 11.004 5700 1V S 2W 11.005 IEEE [D4000]meas; vmin? 11.006 IEEE [I] 11.007 MEMC 1.000V 0.01U VMIN #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 12.001 5700 1V S 2W 12.002 IEEE [D4000]meas; vmax? 12.003 IEEE [I] 12.004 MEMC 1.000V 0.01U VMAX #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 13.001 IEEE chan 2; offset -1 13.002 5700 -1V S 2W 13.003 IEEE [D4000]meas; vmin? 13.004 IEEE [I] 13.005 MEMC -1.000V 0.01U VMIN #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 14.001 5700 -1V S 2W 14.002 IEEE [D4000]meas; vmax? 14.003 IEEE [I] 14.004 MEMC -1.000V 0.01U VMAX #! Test Tol 0.01, Sys Tol 7.2e-006, TUR 1388.889 (>= 4.00). 15.001 IEEE chan 2; range 400e-3 15.002 5700 -1V S 2W 15.003 IEEE [D4000]meas; vmin? 15.004 IEEE [I] 15.005 MEMC -1.000V 0.06U VMIN #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 16.001 5700 -1V S 2W 16.002 IEEE [D4000]meas; vmax? 16.003 IEEE [I] 16.004 MEMC -1.000V 0.06U VMAX #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 17.001 IEEE chan 2; offset 1 17.002 5700 1V S 2W 17.003 IEEE [D4000]meas; vmin? 17.004 IEEE [I] 17.005 MEMC 1.000V 0.06U VMIN #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 18.001 5700 1V S 2W 18.002 IEEE [D4000]meas; vmax? 18.003 IEEE [I] 18.004 MEMC 1.000V 0.06U VMAX #! Test Tol 0.06, Sys Tol 7.2e-006, TUR 8333.333 (>= 4.00). 19.001 HEAD {* Channel 1 Voltage Measurement Accuracy Test *} 19.002 JMP 20.001 19.003 EVAL Dummy 20.001 HEAD Channel 1 Voltage Measurement Accuracy Test 20.002 DISP Move the output of the 5700A to INPUT 1 of UUT. 20.003 IEEE reset 20.003 IEEE display; format 1 20.003 IEEE channel 1; range 300e-3; store ave, 4 20.003 IEEE timebase; range 1e-6 20.003 IEEE measure; vmin 1; vmax 1 20.004 5700 100mV S 2W 20.005 IEEE [D10000]measure; vmin? 20.006 IEEE [I] 20.007 MATH mem = mem * 1000 20.008 MEMC 100.000mV 15U VMIN #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 21.001 5700 100mV S 2W 21.002 IEEE [D10000]measure; vmax? 21.003 IEEE [I] 21.004 MATH mem = mem * 1000 21.005 MEMC 100.000mV 15U VMAX #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 22.001 5700 -100mV S 2W 22.002 IEEE [D10000]measure; vmin? 22.003 IEEE [I] 22.004 MATH mem = mem * 1000 22.005 MEMC -100.000mV 15U VMIN #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 23.001 5700 -100mV S 2W 23.002 IEEE [D10000]measure; vmax? 23.003 IEEE [I] 23.004 MATH mem = mem * 1000 23.005 MEMC -100.000mV 15U VMAX #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 24.001 IEEE chan 1; range 20 24.002 5700 -5V S 2W 24.003 IEEE [D10000]measure; vmin? 24.004 IEEE [I] 24.005 MEMC -5.000V 0.77U VMIN #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 25.001 5700 -5V S 2W 25.002 IEEE [D10000]measure; vmax? 25.003 IEEE [I] 25.004 MEMC -5.000V 0.77U VMAX #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 26.001 5700 5V S 2W 26.002 IEEE [D10000]measure; vmin? 26.003 IEEE [I] 26.004 MEMC 5.000V 0.77U VMIN #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 27.001 5700 5V S 2W 27.002 IEEE [D10000]measure; vmax? 27.003 IEEE [I] 27.004 MEMC 5.000V 0.77U VMAX #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 28.001 HEAD {* Channel 2 Voltage Measurement Accuracy Test *} 28.002 JMP 29.001 28.003 EVAL Dummy 29.001 HEAD Channel 2 Voltage Measurement Accuracy Test 29.002 DISP Move the output of the 5700A to INPUT 2 of UUT. 29.003 IEEE channel 2; range 300e-3; store ave, 4 29.003 IEEE graph 1; source chan 2 29.003 IEEE measure; scratch 29.003 IEEE measure; vmin 2; vmax 2 29.004 5700 100mV S 2W 29.005 IEEE [D10000]measure; vmin? 29.006 IEEE [I] 29.007 MATH mem = mem * 1000 29.008 MEMC 100.000mV 15U VMIN #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 30.001 5700 100mV S 2W 30.002 IEEE [D10000]measure; vmax? 30.003 IEEE [I] 30.004 MATH mem = mem * 1000 30.005 MEMC 100.000mV 15U VMAX #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 31.001 5700 -100mV S 2W 31.002 IEEE [D10000]measure; vmin? 31.003 IEEE [I] 31.004 MATH mem = mem * 1000 31.005 MEMC -100.000mV 15U VMIN #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 32.001 5700 -100mV S 2W 32.002 IEEE [D10000]measure; vmax? 32.003 IEEE [I] 32.004 MATH mem = mem * 1000 32.005 MEMC -100.000mV 15U VMAX #! Test Tol 0.015, Sys Tol 1.45e-006, TUR 10344.828 (>= 4.00). 33.001 IEEE chan 2; range 20 33.002 5700 -5V S 2W 33.003 IEEE [D10000]measure; vmin? 33.004 IEEE [I] 33.005 MEMC -5.000V 0.77U VMIN #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 34.001 5700 -5V S 2W 34.002 IEEE [D10000]measure; vmax? 34.003 IEEE [I] 34.004 MEMC -5.000V 0.77U VMAX #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 35.001 5700 5V S 2W 35.002 IEEE [D10000]measure; vmin? 35.003 IEEE [I] 35.004 MEMC 5.000V 0.77U VMIN #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 36.001 5700 5V S 2W 36.002 IEEE [D10000]measure; vmax? 36.003 IEEE [I] 36.004 MEMC 5.000V 0.77U VMAX #! Test Tol 0.77, Sys Tol 2.9e-005, TUR 26551.724 (>= 4.00). 37.001 HEAD 37.002 DISP Disconnect test setup. 37.003 END #! T.U.R.s less than 4.00: 0 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.